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Laser Thermal Analysis

  • SSTR-F
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High Resolution Thermal Mapping

Users are able to thermally map their samples for thermal conductivity.

August 14, 2020 by admin

Using the SSTR-F and automated X-Y movement testing stage, users are able to thermally map their samples for thermal conductivity. The testing
spot size can be changed via varying objectives from 1 to 100 microns for sensitivity tuning, while the step size can be optimized to match the
micro-structural length scales of a sample.

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  • SSTR-F
    • Features
    • Sample Measurement
  • Thermal Mapping
  • Applications
    • High Thermal Conductivity
    • High Thermal Conductivity Coatings
  • About
    • Our Team
  • Contact

Contact Us

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