Thermal Conductivity Case Studies Using SSTR

Laser Thermal Case Studies Using SSTR
Using SSTR to Spatially Isolate Defect Layers on Thin Films

Using SSTR to Spatially Isolate Defect Layers on Thin Films

SSTR can measure the thermal conductivity of thin films to isolate the conductivity effects of defect layers from high quality crystalline regimes.

Using SSTR to Spatially Isolate Defect Layers on Thin Films

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

SSTR can measure the thermal conductivity of films as thin as 1 nm, shown here for thin dielectric films (TiO2, Al2O3 and HfO2) on silicon substrates.

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

SSTR offers the penetration ability needed to measure thermal conductivities for structures buried too deep for traditional methods.

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

We used SSTR to measure the in plane thermal conductivity of thin AlN films, successfully demonstrating that their in plane thermal conductivities are record setting, exceeding the heat dissipating ability of even diamond.

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

Measuring Extreme Thermal Conductivity Ranges

Measuring Extreme Thermal Conductivity Ranges

SSTR enables the measurement of extreme thermal conductivity ranges that prove challenging for traditional metrology approaches, including materials ranging from diamon to PCBM.

Measuring Extreme Thermal Conductivity Ranges

Detecting Sub-Surface Defect Layers

Detecting Sub-Surface Defect Layers

SSTR can be used to detect defective substrate layers at depths impossible to resolve for traditional thermal metrology techniques.

Detecting Sub-Surface Defect Layers