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- - - THERMAL METROLOGY INSTRUMENTS
      
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      Frequency and Steady-State ThermoReflectance
      Complete thermal characterization for thin films & coatings, multilayered interfaces, semiconductor wafers, wide bandgap semiconductors, and dielectric stacks
      
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      Steady-State and Lock-In Thermography
      Thermal conductivity for thin films, TIMs, liquids, pastes, and bulk materials
      
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      WEBINAR ON DEMAND
      
      Thermal Measurements for Emerging Materials
      
      This webinar covers the thermal measurement methodologies and instruments for thin films, TIMs, and high-temperature materials.
      
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ISTFA 2026

June 18, 2026 apercival

International Symposium for Testing and Failure Analysis