High-purity aluminum nitride (AIN) coatings were grown on sapphire wafers at thickness of 6 μm.

SSTR-F
Steady-State ThermoReflectance in Fiber Optic
Non-contact thermal conductivity testing for coatings, thin-films and bulk materials from 0.05 to 2500 W/m·K.
Applications

Bulk High Thermal Conductivity – Small Samples
Single Crystal silicon carbide (4H-SiC) wafer pieces of 2 mm diameter x 0.5mm thickness were measured for thermal conductivity.

High Resolution Thermal Mapping
Users are able to thermally map their samples for thermal conductivity.
Ready to start your project?
Start where you are. Use what you have. Do what you can.