Research Publications
Lock-in infrared thermography: Phase analysis for rapid, wide-range thermal conductivity measurements
Thermal metrology instruments and testing services for thin films,
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You’ve refined the formulation, optimized the process, or developed an entirely new material. Yet its thermal behavior doesn’t match expectations, published properties, or simulation results.
What happens when the measurements themselves are part of the uncertainty?
Your existing tools still do what they were designed to do. The measurements you need demand a different approach:
High-throughput instrumentation, repeatable measurements, and automated operation and analysis,
for materials and interfaces at the nano, micro, and macro scales.
Thermal properties measurements & thermal property imaging from ultrathin films to bulk materials. Explore FASTR
Thermal conductivity measurements for solids, liquids, pastes, gels, and foams. Explore TOPS
Accelerate your R&D and gain a competitive edge with our full-service thermal characterization testing laboratory. From advanced materials and thin films to solids and liquids, we provide rapid testing, on our high-performance instruments and deliver precise measurements.
Our expert team and state-of-the-art instruments offer testing solutions, whether on a project basis or through bundled support packages.
Explore how to address the requirements of your industry or the thermal challenges you’re working to solve. We’ll guide you to the relevant expertise, measurement capabilities, and solutions.
Today’s performance limits increasingly live in architectures, where films are thinner, conductivities are higher, interfaces are buried, and heat flows differently by direction. Thermal is no longer only a design question. It’s a reliability, schedule, and yield question.
Automated alignment, calibration, and analysis minimize operator-dependent variability. Engineers get repeatable data to validate models and defend decisions. Leadership gets a sound basis for moving the project forward.
Send samples to our lab to compare materials or evaluate a process change, with no capital commitment. When the questions keep coming, bring the same capability in-house and stop waiting on outside queues.
Rapid measurements, automated workflows, and high-throughput characterization bring thermal data into the development process when it matters most. Investigate performance without waiting for lengthy measurement and analysis cycles, and before it turns into a redesign.
The measurement that starts in your R&D lab becomes the process control your production line runs on. Thermal metrology is moving toward near-line and in-line use, and our roadmap is built for that path.
The logos below are only those we’re able to share publicly. Our broader customer base includes many of the leading chipmakers, equipment makers, materials suppliers, and national laboratories driving their industry forward.
Lock-in infrared thermography: Phase analysis for rapid, wide-range thermal conductivity measurements
Overcoming Challenges in Thermal Conductivity Measurement, from Soft TIMs to CVD Diamond
Thermal characterization matters more as AI accelerators intensify an existing package-level bottleneck
Five Key Challenges for Increasing U.S. Domestic Semiconductor Manufacturing Capacity
What is Thermoreflectance?
Unlocking Thermal Measurements in Thin Films
Overcoming Challenges in Thermal Property Measurement and Imaging of TIMs
Thermal Measurements for Emerging Materials – State-of-the-art measurements for thin films, TIMs, and high-temperature materials
Heat Beneath the Surface: Thermal Metrology for Advanced Semiconductor Materials and Architectures
Unveiling Phonon Contributions to Thermal Conductivity and the Applicability of the Wiedemann–Franz Law in Ruthenium and Tungsten Thin Films.
A thermo-optical plane source method to measure thermal conductivity
Limitations and Advances in Optical Thermal Transport Measurements: Extremes in Properties, Length Scales, and Temperature
Characterization of AlF3-Passivated Aluminum Mirrors using non-contact thermal metrology
Thermal Conductivity
Thermal Resistance
Specific Heat, Volumetric Heat Capacity, and Thermal Diffusivity
Introduction to Thermal Metrology
YouTube Channel Laser Thermal
High Thermal Conductivity and Thermal Boundary Conductance of Homoepitaxially Grown Gallium Nitride (GaN) Thin Films
Thermal Conductivity Measurements of Sub-Surface Buried Substrates by Steady-State Thermoreflectance
High In-Plane Thermal Conductivity of Aluminum Nitride Thin Films
Spatially Resolved Thermoreflectance Techniques for Thermal Conductivity Measurements from the Nanoscale to the Mesoscale
A Steady-State Thermoreflectance Method to Measure Thermal Conductivity
Volumetric Heat Capacity Unit Conversion Calculator
Thermal Conductivity Unit Converter
Temperature Rise Calculators
Thermal Energy Unit Conversion Calculator
We look forward to collaborating with you to understand your specific needs and provide tailored solutions for your project’s success.