High-purity aluminum nitride (AIN) coatings were grown on sapphire wafers at thickness of 6 μm.
Thin film thermal conductivity measurements with SSTR-F
Steady-State ThermoReflectance in Fiber Optic
Non-contact thin film thermal conductivity measurements of coatings, films and bulk materials from 0.05 to 2500 W/m·K.
Bulk High Thermal Conductivity – Small Samples
Single Crystal silicon carbide (4H-SiC) wafer pieces of 2 mm diameter x 0.5mm thickness were measured for thermal conductivity.
High Resolution Thermal Mapping
Users are able to thermally map their samples for thermal conductivity.