Lead Your Industry

Discover the accessible, user-friendly tool for getting accurate thermal conductivity data.

Semiconductors

Academic and Government Research

Semiconductors

Beat your competitors to market.

We understand the barriers that have been keeping you from collecting reliable thermal conductivity data. Previous testing methods have been tedious, finicky, and reserved for the highly-trained, only to turn out mediocre or unusable results. It doesn’t have to be this hard.

Our solution, SSTR-F, will put you on the cutting edge of thermal conductivity and thermal resistance testing.

Using SSTR-F as a foundation for your research, you can:

Optimize the performance of your products
Solve problems with accurate data
Get your product on the market faster

The industry is only getting faster. You can’t afford tedious measurements and faulty data. SSTR-F is the solution to helping you outpace your competitors.

Request a Quote

Download Whitepaper

Academic and Government Research

Things are heating up.

In the past it’s been a struggle to get usable or even repeatable data when it comes to thermal conductivity. As researchers and academics ourselves, we understand the frustration and time-consuming repeated tests that currently dominate the field.

We are here to provide you with a straightforward, in-house solution to data collection: SSTR-F.

SSTR-F will help you:

Get fast and accurate measurements without extensive training
Involve students and fellow researchers without fear of unrepeatable results
Move your research forward and increase its visibility

Do you feel like you’re on the verge of a breakthrough? We agree. SSTR-F is the solution that will push your ideas from theory to reality.

Request a Quote

Download Whitepaper

Establish Your Expertise and Lead Your Industry

SSTR-F is the research tool you’ve been waiting for.

Request a Quote

Nanoscale to bulk

Thermal conductivity of nanoscale thin films

SSTR is ideal for your thin film thermal conductivity testing needs.
In addition to measurements of bulk wafers and substrates (source 1, source 2), SSTR has the unprecedented spatial resolution to measure the thermal conductivity of thin films.
For example, SSTR can measure the thermal conductivity of single nanometer thick ALD grown thin films or micron thick AlN films (source).

SSTR measurements on ALD grown ultrathin film amorphous gate dielectrics (compared to TDTR) (source).

SSTR measurements of AlN crystalline thin films.2 SSTR data (temperature rise vs. power) on right for AlN film and silicon wafer control.

Validated results

SSTR-F measures the thermal conductivity of Corning Pyroceram 9606 and Corning high purity fused silica (HPFS) 7980 to within 5% of their published values.
Additional validation was provided by measuring samples from the same piece of material using the Transient Plane Source technique.
Pyroceram is no longer available from NIST but was measured on similar material to the material that was validated as a Certified Reference Material.
Corning HPFS was procured from a distributor of HPFS 7980 wafers.

	Literature Value	TPS Measurement	SSTR-F Measurement
Pyroceram 9606	4.07 +/- .26	3.95	3.95 +/- 0.2
HPFS 7980	1.38	1.39	1.39 +/- 0.09

Unparalleled reliability

Thermal conductivity measurements: Accuracy +/- 10%, Repeatability +/- 0.5%, Reproducibility +/- 1%
Accurate thermal conductivity measurements of materials in agreement with literature values
With exceptional instrumentation reliability and repeatability, SSTR-F offers unprecedented measurement stability on a daily basis for any user, exemplified by the SSTR-F data shown below. Spread in randomly sampled spots are sample related, not measurement driven.

Source

20 SSTR-F measurements at same spot

20 SSTR-F measurements at random spots

Turnkey testing

Our patented fiber-optic design enables turnkey, automated testing of thermal conductivity.
High-throughput SSTR-F testing of multiple samples facilitates, for example, screening the thermal conductivity of different thin films processed under different conditions
Defects, stresses, compositional differences, and changes in density and microstructure that occur up during film growth result in changes in thermal conductivity, easily and rapidly identified vis SSTR-F

SSTR-F data on 4 different 200 nm dielectric films on silicon with thermal conductivity ranging from ~0.35 W/m/K up to 1.8 W/m/K. SSTR-F allows for easy, rapid and automated identification of different temperature rises based on the thermal conductivity of the different films.