Application Briefs

Thermal Conductivity Solutions Using SSTR-F

Laser Thermal offers high resolution thermal measurements using steady-state thermoreflectance technology (SSTR-F). See how advanced thermal metrology is enabling better quality control and solving common conductivity challenges with thin film, sub-surface buried substrates, and more.

Application Briefs

With application across a variety of industries and settings, see how SSTR-F can enable innovation for companies and researchers across the country.

Using SSTR to Spatially Isolate Defect Layers on Thin Films

SSTR can measure the thermal conductivity of thin films to isolate the conductivity effects of defect layers from high-quality crystalline regimes.

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

SSTR-F measures the thermal conductivity of films as thin as 1 nm, shown here for thin dielectric films (TiO2, Al2O3 and HfO2) on silicon substrates.

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

SSTR-F offers the penetration ability needed to measure thermal conductivities for structures buried too deep for traditional methods.

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

SSTR-F measures the in-plane thermal conductivity of thin AlN films, proving in-plane thermal conductivities are record-setting, exceeding the heat dissipating ability of even diamond.

Measuring Extreme Thermal Conductivity Ranges

SSTR-F measures extreme thermal conductivity ranges that prove challenging for traditional metrology approaches, including materials ranging from diamond to PCBM.

Detecting Sub-Surface Defect Layers

SSTR-F can be used to detect defective substrate layers at depths impossible to resolve for traditional thermal metrology techniques.

GaN HEMTs Application Brief

SSTR-F shows that varying the thickness of undoped GaN layers above the buffer can significantly affect the device’s heat management ability.

Using SSTR to Spatially Isolate Defect Layers on Thin Films

Using SSTR to Spatially Isolate Defect Layers on Thin Films

SSTR can measure the thermal conductivity of thin films to isolate the conductivity effects of defect layers from high quality crystalline regimes.

Using SSTR to Spatially Isolate Defect Layers on Thin Films

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

SSTR can measure the thermal conductivity of films as thin as 1 nm, shown here for thin dielectric films (TiO2, Al2O3 and HfO2) on silicon substrates.

Measuring Thermal Conductivity and Resistance for Dielectric Films as Thin as 1 Nanometer

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

SSTR offers the penetration ability needed to measure thermal conductivities for structures buried too deep for traditional methods.

Measuring the Thermal Conductivity of Buried Sub-Surface Materials and Substrates

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

We used SSTR to measure the in plane thermal conductivity of thin AlN films, successfully demonstrating that their in plane thermal conductivities are record setting, exceeding the heat dissipating ability of even diamond.

Measuring In-Plane Thermal Conductivity and Anisotropy of Thin AIN Films

Measuring Extreme Thermal Conductivity Ranges

Measuring Extreme Thermal Conductivity Ranges

SSTR enables the measurement of extreme thermal conductivity ranges that prove challenging for traditional metrology approaches, including materials ranging from diamon to PCBM.

Measuring Extreme Thermal Conductivity Ranges

Detecting Sub-Surface Defect Layers

Detecting Sub-Surface Defect Layers

SSTR can be used to detect defective substrate layers at depths impossible to resolve for traditional thermal metrology techniques.

Detecting Sub-Surface Defect Layers