As thermal scientists, we have been in your shoes spending years struggling to get fast, accurate and reliable thermal metrology data —especially for thin films and complex structures. Approximations and workarounds might get you close; but close isn’t good enough when you’re trying to model performance, optimize materials, or validate designs.
Born out of decades of academic research and development in the ExSiTE Lab at the University of Virginia, Laser Thermal has revolutionized thermal conductivity measurements of materials, from thin films to bulk wafers and composites with a ground breaking innovation in thermal metrology, Steady State Thermoreflectance in Fiber Optics (SSTR-F). SSTR-F is a non-contact, non-destructive thermal property measurement system that facilitates turnkey, high throughput measurements for users without a background in thermal metrologies, optics or laser systems.
Since SSTR-F, we have brought new products to our suite of full-service thermal analysis tools — Thermo-Optical Plane Source (TOPS) and Frequency And Steady-state ThermoReflectance (FASTR). These instruments address longstanding gaps in the market: accurate, high-throughput, and user-friendly measurement of thermal conductivity, resistance, and volumetric heat capacity across a wide range of material thermal properties and length scales.
