FASTR
Frequency and Steady-State ThermoReflectanceComplete thermal characterization for thin films & coatings, multilayered interfaces, semiconductor wafers, wide bandgap semiconductors, and dielectric stacks
TOPS
Steady-State and Lock-In ThermographyThermal conductivity for thin films, TIMs, liquids, pastes, and bulk materials
User Manuals
Software Download
Thermal Measurements for Emerging Materials
This webinar covers the thermal measurement methodologies and instruments for thin films, TIMs, and high-temperature materials.
