Virginia Startup’s $2.9 Million Expansion Sparks Innovation and Job Growth – Read more In a significant boost to the technological landscape of Virginia, Laser Thermal, a nanotechnology company born out of the University of Virginia, has embarked on an exciting expansion in the City of Charlottesville. Governor Glenn Youngkin recently unveiled the company’s plans to...
Laser Thermal Partners with Angstrom Scientific, Inc. for Sales Representation of Thermal Conductivity Instruments and Contract Testing Services With a Proven Track Record Since 2004, Angstrom Scientific Brings Robust Expertise in Characterization Solutions to Nanotechnology Researchers CHARLOTTESVILLE, VA, January 16, 2024 – Laser Thermal, a leading provider of advanced thermal property measurement tools, is pleased...
Laser Thermal technology has taken center stage in a recent edition of UVAToday, and for a compelling reason – it’s transforming the landscape of thermal measurements. In a world where precision and efficiency are paramount to innovation, Laser Thermal promises to revolutionize the way we understand, analyze, and develop products using temperature dynamics. This groundbreaking...
Unveiling Laser Thermal’s Innovative Solutions Thermal metrology plays a critical role in a wide variety of industries, from electronics to manufacturing, ensuring the reliability and efficiency of products. However, traditional thermal measurement practices can be time-consuming, complex, and often require specialized knowledge. That’s why the researchers at Laser Thermal developed SSTR-F: the world’s first steady...
In this blog, we provide an overview of thermal boundary resistance, why understanding it is critical when engineering semiconductor devices, some critical challenges for interfacial thermal metrology, and how thermal testing services can help. What is thermal boundary resistance? Thermal boundary resistance is simply a measure of resistance to heat flow at the interface between...
A summary of some of the biggest trends for the semiconductor industry heading into 2023.
A summary of some of the biggest trends for the semiconductor industry heading into 2023.
Traditional thermal metrology techniques cannot be relied upon to generate reliable thermal resistance data for thin film materials.
Traditional thermal metrology techniques cannot be relied upon to generate reliable thermal resistance data for thin film materials.
Semiconductor devices often operate under sustained thermal stresses. Understanding the thermal resistances of the materials used in these devices is essential to mitigate thermal failure and maximize performance, reliability, and manufacturing yield.
SSTR measurements on ALD grown ultrathin film amorphous gate dielectrics (compared to TDTR) (source).
SSTR measurements of AlN crystalline thin films.2 SSTR data (temperature rise vs. power) on right for AlN film and silicon wafer control.
| Literature Value | TPS Measurement | SSTR-F Measurement | |
| Pyroceram 9606 | 4.07 +/- .26 | 3.95 | 3.95 +/- 0.2 |
| HPFS 7980 | 1.38 | 1.39 | 1.39 +/- 0.09 |
20 SSTR-F measurements at same spot
20 SSTR-F measurements at random spots
SSTR-F data on 4 different 200 nm dielectric films on silicon with thermal conductivity ranging from ~0.35 W/m/K up to 1.8 W/m/K. SSTR-F allows for easy, rapid and automated identification of different temperature rises based on the thermal conductivity of the different films.