Build the Future Generation of Semiconductor Chips

Get accurate, repeatable thermal conductivity data for every material you use with SSTR-F.
Beat Your Competition to Market
Reduce R&D Timelines
Build Better, Faster Products

Work Arounds Aren’t Good Enough

We know you’ve been stuck using workarounds, best guesses, and approximations when it comes to thermal data--many of which don’t hold up in real-world applications--because you’ve never had a tool that directly measures the thermal conductivity of semiconductor materials, interfaces substrates, and thin films.

That’s why we created SSTR-F--the first tool of its kind to bring fast, easy, accurate thermal conductivity and thermal resistance semiconductor testing in-house for manufacturers.

Better Semiconductor Testing. Better Products.

If you want your devices to not just perform as modeled, but to be faster and more powerful, you’ve got to use accurate, reliable thermal data.

Optimize Performance

By having data on the thermal properties of every material in your devices, you can make better informed decisions and enhance function.

Solve Problems

When you understand the thermal metrology of your materials, you can pinpoint the problems, identify solutions, and enable the team with answers.

Get to Market Faster

Instead of model after model, cut straight to the solutions so you can shrink R&D and present your innovations ahead of your competitors.

The Missing Piece to the Optimization Puzzle

Bringing thermal testing in house with SSTR-F doesn't just make your job easier now, but streamlines your thermal metrology practices for the future.

Get in on the ground floor of the thermal metrologies revolution.

Catalog & Create Baselines

Using the results of your testing, you can create a bank of reliable measurements for future projects so you can plug and play with numbers you trust.

Customize Data Processing

Get the data you want, in the format you want it. Our team works with you to customize software and uses your input for the next generation of hardware.

Innovate & Move Forward

Change your outlook from limitations to possibility with data that supports your innovations and fuels your faster, better, superior products.
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Laser Thermal Awarded NIST Collaboration

As part of the CHIPS for America initiative, our SSTR-F tool will address vital challenges in semiconductor metrology.

Designed for the Real World

Check out our case studies.

Your Competitors Aren’t Slowing Down

Beat them to market with Laser Thermal