Sample |
SSTR-value (W/m/K) |
uncertainty (W/m/K) |
publication/notes |
Literature |
Uncertainty |
measurement technique, notes |
notes |
PCBM |
0.05 |
0.01 |
Physical Review Materials 4, 065404, 2020 |
0.05 |
0.02 |
TDTR, PPMS |
Uncertainty based on spread in data from multiple prior papers: Physical Review Materials, 4:065404, 2020, Physical Review Letters, 110:015902, 2013, Physical Chemistry Chemical Physics, 18:1185–1190, 2015, Physical Review B, 88:075310, 2013 |
a-SiO2 |
1.07 |
0.09 |
Review of Scientific Instruments, 90, 024905 (2019) |
1.06 |
0.03 |
Transient hot wire |
Int. J. Thermophysics 26, 1595 (2005) |
z-cut Quartz |
8.63 |
0.36 |
Review of Scientific Instruments, 90, 024905 (2019) |
8.6 |
|
TDTR |
Rev. Sci. Instrum. 85, 104903 (2014) |
Sapphire |
35 |
1.4 |
Review of Scientific Instruments, 90, 024905 (2019) |
34 |
|
TDTR |
Appl. Phys. Lett. 107, 203112 (2015) |
Silicon |
136 |
7 |
Review of Scientific Instruments, 90, 024905 (2019) |
133 |
|
TDTR |
Appl. Phys. Lett. 107, 203112 (2015) |
GaN |
194 |
27 |
Review of Scientific Instruments, 92, 064906 (2021) |
195 |
|
Scanning thermal microscope |
J. Appl. Phys. 88, 3295 (2000) |
AlN |
300 |
30 |
ACS Applied Materials & Interfaces, 12, 29443 (2020) |
321 |
42 |
TDTR |
Phys. Rev. Mat. 4, 044602 (2020) |
4H-SiC |
335 |
28 |
Review of Scientific Instruments, 90, 024905 (2019) |
364 |
|
TDTR |
Materials Today Physics 3, 70 (2017) |
Diamond |
2010 |
460 |
Review of Scientific Instruments, 90, 024905 (2019) |
1900 |
500 |
TDTR |
Applied Physics Letters 111, 151902 (2017) |