ResourcesThermal Conductivity Database

SSTR Data Summary Literature
Sample SSTR-value (W/m/K) uncertainty (W/m/K) publication/notes Literature Uncertainty measurement technique, notes notes
PCBM 0.05 0.01 Physical Review Materials 4, 065404, 2020 0.05 0.02 TDTR, PPMS Uncertainty based on spread in data from multiple prior papers: Physical Review Materials, 4:065404, 2020, Physical Review Letters, 110:015902, 2013, Physical Chemistry Chemical Physics, 18:1185–1190, 2015, Physical Review B, 88:075310, 2013
a-SiO2 1.07 0.09 Review of Scientific Instruments, 90, 024905 (2019) 1.06 0.03 Transient hot wire Int. J. Thermophysics 26, 1595 (2005)
z-cut Quartz 8.63 0.36 Review of Scientific Instruments, 90, 024905 (2019) 8.6 TDTR Rev. Sci. Instrum. 85, 104903 (2014)
Sapphire 35 1.4 Review of Scientific Instruments, 90, 024905 (2019) 34 TDTR Appl. Phys. Lett. 107, 203112 (2015)
Silicon 136 7 Review of Scientific Instruments, 90, 024905 (2019) 133 TDTR Appl. Phys. Lett. 107, 203112 (2015)
GaN 194 27 Review of Scientific Instruments, 92, 064906 (2021) 195 Scanning thermal microscope J. Appl. Phys. 88, 3295 (2000)
AlN 300 30 ACS Applied Materials & Interfaces, 12, 29443 (2020) 321 42 TDTR Phys. Rev. Mat. 4, 044602 (2020)
4H-SiC 335 28 Review of Scientific Instruments, 90, 024905 (2019) 364 TDTR Materials Today Physics 3, 70 (2017)
Diamond 2010 460 Review of Scientific Instruments, 90, 024905 (2019) 1900 500 TDTR Applied Physics Letters 111, 151902 (2017)