Thermal Conductivity Database

SSTR Data Summary Literature

*Disclaimer: Because each material is process-dependent, properties will likely vary from these numbers. We recommend that you test to validate your assumptions.

SampleSSTR-value (W/m/K)uncertainty (W/m/K)publication/notesLiteratureUncertaintymeasurement technique, notesnotes
PCBM0.050.01Physical Review Materials 4, 065404, 20200.050.02TDTR, PPMSUncertainty based on spread in data from multiple prior papers: Physical Review Materials, 4:065404, 2020, Physical Review Letters, 110:015902, 2013, Physical Chemistry Chemical Physics, 18:1185–1190, 2015, Physical Review B, 88:075310, 2013
a-SiO21.070.09Review of Scientific Instruments, 90, 024905 (2019)1.060.03Transient hot wireInt. J. Thermophysics 26, 1595 (2005)
z-cut Quartz8.630.36Review of Scientific Instruments, 90, 024905 (2019)8.6TDTRRev. Sci. Instrum. 85, 104903 (2014)
Sapphire351.4Review of Scientific Instruments, 90, 024905 (2019)34TDTRAppl. Phys. Lett. 107, 203112 (2015)
Silicon1367Review of Scientific Instruments, 90, 024905 (2019)133TDTRAppl. Phys. Lett. 107, 203112 (2015)
GaN19427Review of Scientific Instruments, 92, 064906 (2021)195Scanning thermal microscopeJ. Appl. Phys. 88, 3295 (2000)
AlN30030ACS Applied Materials & Interfaces, 12, 29443 (2020)32142TDTRPhys. Rev. Mat. 4, 044602 (2020)
4H-SiC33528Review of Scientific Instruments, 90, 024905 (2019)364TDTRMaterials Today Physics 3, 70 (2017)
Diamond2010460Review of Scientific Instruments, 90, 024905 (2019)1900500TDTRApplied Physics Letters 111, 151902 (2017)