Outpace Your Competition

In this short video you will learn how to bring thermal conductivity and thermal resistance measurement in-house so you can fuel innovation.

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Shrink R&D Timelines

Get Unlimited Access to Thermal Data

Create Better Products

Don’t Let Approximations Hold You Back

Basing your thermal modeling on best guesses isn’t ideal, but it’s what everyone has been forced to do for years. Wouldn’t it be nice if you could quickly and easily measure and understand the thermal properties of every material you work with?

Watch our video to learn how Laser Thermal’s new tool, the SSTR-F, will help you do just that.

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Get the Data You Need, When You Actually Need It

(And yes, we know you needed it yesterday.)

Better than 'Good Enough'

You shouldn’t have to settle on the quality of your data. We’ll show you how to get reliable, repeatable data from your own facility.

Speed Up Development

Stop wondering how your competitors passed you up. With the right data in hand, you can fast-track your process and surpass your goals.

Do Your Job

Instead of wasting time on workarounds and back guesses, understand the full performance metrics of materials so you can model and design accurately.

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The Clock is Ticking…

Will your competitors beat you to the next best thing?
Watch our video to beat the clock.

In less than 6 minutes you’ll learn…

An alternative to common thermal measurement practices

A way to reduce time spent on thermal testing

How to get thermal measurements for bulk materials, interfacial thermal resistance, and thin film measurements

How to get repeatable measurement regardless of user

Why your measurements don’t have to be performed by a Ph.D.

And more!

The Future of Thermal Metrologies Starts Now

Discover how Laser Thermal will keep you from getting left behind.

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Nanoscale to bulk

Thermal conductivity of nanoscale thin films

SSTR is ideal for your thin film thermal conductivity testing needs.
In addition to measurements of bulk wafers and substrates (source 1, source 2), SSTR has the unprecedented spatial resolution to measure the thermal conductivity of thin films.
For example, SSTR can measure the thermal conductivity of single nanometer thick ALD grown thin films or micron thick AlN films (source).

SSTR measurements on ALD grown ultrathin film amorphous gate dielectrics (compared to TDTR) (source).

SSTR measurements of AlN crystalline thin films.2 SSTR data (temperature rise vs. power) on right for AlN film and silicon wafer control.

Validated results

SSTR-F measures the thermal conductivity of Corning Pyroceram 9606 and Corning high purity fused silica (HPFS) 7980 to within 5% of their published values.
Additional validation was provided by measuring samples from the same piece of material using the Transient Plane Source technique.
Pyroceram is no longer available from NIST but was measured on similar material to the material that was validated as a Certified Reference Material.
Corning HPFS was procured from a distributor of HPFS 7980 wafers.

	Literature Value	TPS Measurement	SSTR-F Measurement
Pyroceram 9606	4.07 +/- .26	3.95	3.95 +/- 0.2
HPFS 7980	1.38	1.39	1.39 +/- 0.09

Unparalleled reliability

Thermal conductivity measurements: Accuracy +/- 10%, Repeatability +/- 0.5%, Reproducibility +/- 1%
Accurate thermal conductivity measurements of materials in agreement with literature values
With exceptional instrumentation reliability and repeatability, SSTR-F offers unprecedented measurement stability on a daily basis for any user, exemplified by the SSTR-F data shown below. Spread in randomly sampled spots are sample related, not measurement driven.

Source

20 SSTR-F measurements at same spot

20 SSTR-F measurements at random spots

Turnkey testing

Our patented fiber-optic design enables turnkey, automated testing of thermal conductivity.
High-throughput SSTR-F testing of multiple samples facilitates, for example, screening the thermal conductivity of different thin films processed under different conditions
Defects, stresses, compositional differences, and changes in density and microstructure that occur up during film growth result in changes in thermal conductivity, easily and rapidly identified vis SSTR-F

SSTR-F data on 4 different 200 nm dielectric films on silicon with thermal conductivity ranging from ~0.35 W/m/K up to 1.8 W/m/K. SSTR-F allows for easy, rapid and automated identification of different temperature rises based on the thermal conductivity of the different films.