Advancing Government & Academic Research

Get accurate, reliable thermal boundary resistance, thermal conductivity and volumetric heat capacity data with FASTR.

Expand Your Knowledge Base

Focus on Data-Driven Iteration Rather Than Instrument Operation

Lead Your Field

Don’t Let Limited Data Hold You Back

We don’t have to tell you how difficult and time-consuming current thermal measurement tools are. Even in ideal circumstances, the data you get can have a high margin of error and is far from repeatable, let alone scalable. As thermal metrologists, physicists, and material scientists ourselves, we understand the limitations you’re facing. That’s why, through decades of research and more than 300 published papers, we set out to fill existing gaps in thermal metrology with SSTR-F: the first steady-state thermoreflectance tool. SSTR-F has now become FASTR by combining SSTR and FDTR techniques. This is the ultimate tool for quickly and accurately measure thermal metrology for materials, interfaces, thin films, and substrates at the micro to nano length scales.

Get a Free Sample Test

Keep Pace With Materials

As materials and devices continue to get smaller, we’ll help your research keep up.

Precise Measurements

FASTR was designed for researchers who demand accuracy and repeatability you can publish on.
Micrometer-level spatial resolution (1–10 µm) | nanometer depth sensitivity (1 nm–10 µm) | Thermal conductivity range: 0.05 to 3,000 W/m·K). | ±1% repeatability and ±2% reproducibility

Ease of Operation

Let students and researchers get involved without fear of unreliable results or time lost troubleshooting these systems.
Training on FASTR takes less than a day, no PhD or optics experience required.

Accelerate Breakthroughs

Optimize your ability to test, reiterate and refine at a lightning speed, so you can fuel your projects, publish novel results, and develop future leaders in science and engineering.

Request a Quote

Thermal Data You Can Trust

Whether you’re working with academic or government research, FASTR will help you get the data you need for publications, awards, product development and more.

Getting started is easy:

1. Contact our team

Tell us about your thermal measurement needs and learn how we can help you quickly and easily measure materials with values ranging from 0.05 to 3000 W m-1 K-1.

2. Get Fast & Accurate Results

Whether we perform the testing or you add FASTR to your lab, you’ll get reliable, repeatable data in just minutes.

3. Advance Your program and Build the Future

Armed with accurate thermal data, you can lead your field, develop new technologies and products, and pave the way for future breakthroughs.

Laser Thermal Awarded NIST Collaboration

As part of the CHIPS for America initiative, our SSTR-F tool will address vital challenges in semiconductor metrology.

Learn More About Our Partnership

Proven Results

Check out our thermal conductivity database.

Be the First

Lead innovation now and in the future with Laser Thermal.

Request a Quote

Unparalleled reliability

Thermal conductivity measurements: Accuracy +/- 10%, Repeatability +/- 0.5%, Reproducibility +/- 1%
Accurate thermal conductivity measurements of materials in agreement with literature values
With exceptional instrumentation reliability and repeatability, SSTR-F offers unprecedented measurement stability on a daily basis for any user, exemplified by the SSTR-F data shown below. Spread in randomly sampled spots are sample related, not measurement driven.

Source

20 SSTR-F measurements at same spot

20 SSTR-F measurements at random spots

Turnkey testing

Our patented fiber-optic design enables turnkey, automated testing of thermal conductivity.
High-throughput SSTR-F testing of multiple samples facilitates, for example, screening the thermal conductivity of different thin films processed under different conditions
Defects, stresses, compositional differences, and changes in density and microstructure that occur up during film growth result in changes in thermal conductivity, easily and rapidly identified vis SSTR-F

SSTR-F data on 4 different 200 nm dielectric films on silicon with thermal conductivity ranging from ~0.35 W/m/K up to 1.8 W/m/K. SSTR-F allows for easy, rapid and automated identification of different temperature rises based on the thermal conductivity of the different films.

Nanoscale to bulk

Thermal conductivity of nanoscale thin films

SSTR is ideal for your thin film thermal conductivity testing needs.
In addition to measurements of bulk wafers and substrates (source 1, source 2), SSTR has the unprecedented spatial resolution to measure the thermal conductivity of thin films.
For example, SSTR can measure the thermal conductivity of single nanometer thick ALD grown thin films or micron thick AlN films (source).

SSTR measurements on ALD grown ultrathin film amorphous gate dielectrics (compared to TDTR) (source).

SSTR measurements of AlN crystalline thin films.2 SSTR data (temperature rise vs. power) on right for AlN film and silicon wafer control.

	Literature Value	TPS Measurement	SSTR-F Measurement
Pyroceram 9606	4.07 +/- .26	3.95	3.95 +/- 0.2
HPFS 7980	1.38	1.39	1.39 +/- 0.09